Methods for the characterization of nanomaterials
Inventory, Romania
Section A:
Laboratory Name
Organization Name
Contact Person Name
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Section B:

How to fill in Section B:
First thick the checkbox near the desired characterisation technique and then write in the textarea your info.
You may do this for all the equipments at once.
Atomic Force Microscopy (AFM)
Scanning Force Microscopy (SFM)
Electron Diffraction
Scanning Tunneling Microscopy (STM)
Transmission Electron Microscopy (TEM)
Scanning Transmission Electron Microscopy (STEM)
Small Angle Neutron Scattering (SANS)
Small Angle XRay Scattering (SAXS)
Scanning Near-field Optical Microscopy (SNOM or NSOM)
Electron Energy Loss Spectroscopy (EELS)
Energy Dispersive XRay spectroscopy (EDX or EDS or XEDS)
X-Ray Diffraction (XRD)
X-Ray Absorption Spectroscopy (XAS)
Neutron Diffraction
Singlemolecule spectroscopy (SMS)
Auger Electron Spectroscopy (AES)
Polarization Spectroscopy
Photoluminescence Spectrocopy (PL), Electroluminescence Spectroscopy (EL), Cathodoluminescence Spectroscopy (CL)
Fourier Transform Infrared Spectroscopy (FTIR)
Raman Spectroscopy
X-Ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy For Chemical Analysis (ESCA)
Secondary Ion Mass Spectrometry (SIMS)
Differential Scanning Calorimetry (DSC)
Mössbauer Spectroscopy
Nuclear Magnetic Resonance (NMR)
Cyclic Voltammetry (CV) and Linear Sweep Voltammetry (LSV)
Capacitance spectroscopy
Hyphenated techniques, GC/MS, HPLC/MS

Ultima actualizare: 10-Apr-2008